Albrecht Mayer
59Patents
8h-index
34Co-inventors
78Inventor score
Filing activity: Sep 30, 1998 → Nov 7, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6845027B2 | Semiconductor chip | Electricity | 69 | Expired |
| US7870455B2 | System-on-chip with master/slave debug interface | Physics | 26 | Active |
| US8261130B2 | Program code trace signature | Physics | 21 | Active |
| US7886195B2 | Apparatus, system, and method of efficiently utilizing hardware resources for a software test | Physics | 20 | Active |
| US6708270B1 | Programmable unit having on chip debugging support module (OCDS) and reset manager that determines if OCDS should reset if programmable unit is reset | Physics | 19 | Expired |
| US10061729B2 | Scalable multi-core system-on-chip architecture on multiple dice for high end microcontroller | Physics | 9 | Active |
| US6769065B2 | Access authorization device for controlling access requested by an OCDS module | Physics | 9 | Expired |
| US7210064B2 | Program controlled unit and method for debugging programs executed by a program controlled unit | Physics | 8 | Expired |
| US6753204B1 | Method for assembling integrated circuits with protection of the circuits against electrostatic discharge | Electricity | 8 | Expired |
| US7577878B2 | Method for storing or transferring data using time sequencing | Physics | 7 | Expired |
| US9946674B2 | Scalable multi-core system-on-chip architecture on multiple dice for high end microcontroller | Physics | 6 | Active |
| US8825922B2 | Arrangement for processing trace data information, integrated circuits and a method for processing trace data information | Physics | 6 | Active |
| US7281162B2 | Program-controlled unit | Physics | 5 | Expired |
| US6420781B1 | Method for producing emulation circuit configuration, and configuration with two integrated circuits | Electricity | 5 | Expired |
| US8347158B2 | System-on-chip with master/slave debug interface | Physics | 4 | Active |
| US7810004B2 | Integrated circuit having a subordinate test interface | Physics | 4 | Active |
| US7051237B2 | Program-controlled unit | Physics | 4 | Expired |
| US7076418B1 | Method and device for system simulation of microcontrollers/microprocessors and corresponding peripheral modules | Physics | 4 | Expired |
| US9009517B2 | Embedded voltage regulator trace | Physics | 4 | Active |
| US8234531B2 | System-on-chip with master/slave debug interface | Physics | 4 | Active |
| US8484517B2 | High compression program flow trace | Physics | 3 | Active |
| USRE46021E1 | System-on-chip with master/slave debug interface | General | 2 | Active |
| US9740837B2 | Apparatus and method for preventing cloning of code | Physics | 2 | Active |
| US11562079B2 | System-on-chip and method for operating a system-on-chip | Physics | 1 | Active |
| US7000148B2 | Program-controlled unit | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.