Inventor · Austin, TX, US

Alexander Kuznetsov

44Patents
12h-index
61Co-inventors
84Inventor score

Filing activity: Mar 6, 1997 → Mar 7, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US6757122B1 Method and decoding apparatus using linear code with parity check matrices composed from circulants Electricity 70 Expired
US9291554B2 Method of electromagnetic modeling of finite structures and finite illumination for metrology and inspection Physics 52 Active
US7000168B2 Method and coding apparatus using low density parity check codes for data storage or data transmission Electricity 45 Expired
US8860937B1 Metrology systems and methods for high aspect ratio and large lateral dimension structures Electricity 24 Active
US9518916B1 Compressive sensing for metrology Physics 23 Active
US7205912B1 Structured set partitioning and multilevel coding for partial response channels Physics 21 Expired
US8879073B2 Optical metrology using targets with field enhancement elements Electricity 19 Active
US10895541B2 Systems and methods for combined x-ray reflectometry and photoelectron spectroscopy Electricity 17 Active
US5881071A Digital write-and-read method and signal processing apparatus Physics 15 Expired
US10769320B2 Integrated use of model-based metrology and a process model Physics 15 Active
US6718502B1 Precoders for partial response channels Electricity 14 Expired
US7827464B2 Iterative read channel architectures with coded modulation Electricity 12 Active
US7787205B2 Detecting and correcting insertion and deletion of bits for bit patterned media storage systems Physics 10 Active
US9243886B1 Optical metrology of periodic targets in presence of multiple diffraction orders Physics 8 Active
US6933865B1 Method and apparatus for coded symbol stuffing in recording systems Physics 7 Expired
US11036898B2 Measurement models of nanowire semiconductor structures based on re-useable sub-structures Physics 7 Active
US11333621B2 Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffraction Electricity 6 Active
US11156548B2 Measurement methodology of advanced nanostructures Physics 5 Active
US10502694B2 Methods and apparatus for patterned wafer characterization Physics 5 Active
US10352876B2 Signal response metrology for scatterometry based overlay measurements Physics 4 Active
US9255877B2 Metrology system optimization for parameter tracking Physics 3 Active
US8307267B2 Programmable soft-output Viterbi algorithm system and method Physics 3 Active
US10712145B2 Hybrid metrology for patterned wafer characterization Physics 3 Active
US10983227B2 On-device metrology using target decomposition Physics 2 Active
US8037398B2 System for precoding parity bits to meet predetermined modulation constraints Electricity 2 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.