Inventor · Netanya, IL

Amit Batikoff

19Patents
3h-index
25Co-inventors
56Inventor score

Filing activity: Dec 21, 2011 → Nov 8, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US8977035B2 System, method and computer program product for detection of defects within inspection images Physics 9 Active
US11205119B2 Method of deep learning-based examination of a semiconductor specimen and system thereof Physics 4 Active
US9098893B2 System, method and computer program product for classification within inspection images Physics 4 Active
US9851714B2 Method of inspecting a specimen and system thereof Emerging Cross-Sectional Technologies 3 Active
US10545490B2 Method of inspecting a specimen and system thereof Emerging Cross-Sectional Technologies 2 Active
US11010665B2 Method of deep learning-based examination of a semiconductor specimen and system thereof Physics 2 Active
US11348001B2 Method of deep learning-based examination of a semiconductor specimen and system thereof Physics 2 Active
US10430938B2 Method of detecting defects in an object Physics 0 Active
US12183066B2 Method of deep learning-based examination of a semiconductor specimen and system thereof Physics 0 Active
US10928437B2 Method of inspecting a specimen and system thereof Physics 0 Active
US10902620B1 Registration between an image of an object and a description Physics 0 Active
US10012689B2 Method of inspecting a specimen and system thereof Physics 0 Active
US11568565B2 Rendering-based lidar and camera alignment Physics 0 Active
US10120973B2 Method of performing metrology operations and system thereof Physics 0 Active
US10444274B2 Method of inspecting a specimen and system thereof Physics 0 Active
US11292487B2 Methods and systems for controlling automated driving features of a vehicle Performing Operations; Transporting 0 Active
US10296702B2 Method of performing metrology operations and system thereof Physics 0 Active
US12269500B2 Alignment validation in vehicle-based sensors Performing Operations; Transporting 0 Active
US10571406B2 Method of performing metrology operations and system thereof Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.