Andy Tsen
12Patents
5h-index
20Co-inventors
55Inventor score
Filing activity: Mar 3, 2009 → May 12, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8229588B2 | Method and system for tuning advanced process control parameters | Physics | 25 | Active |
| US8437870B2 | System and method for implementing a virtual metrology advanced process control platform | Electricity | 25 | Active |
| US8108060B2 | System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architecture | Emerging Cross-Sectional Technologies | 15 | Active |
| US8041451B2 | Method for bin-based control | Emerging Cross-Sectional Technologies | 8 | Active |
| US8224475B2 | Method and apparatus for advanced process control | Electricity | 6 | Active |
| US8082055B2 | Method for a bin ratio forecast at new tape out stage | Physics | 5 | Active |
| US8394719B2 | System and method for implementing multi-resolution advanced process control | Emerging Cross-Sectional Technologies | 5 | Active |
| US8396583B2 | Method and system for implementing virtual metrology in semiconductor fabrication | Electricity | 4 | Active |
| US8392009B2 | Advanced process control with novel sampling policy | Electricity | 3 | Active |
| US8239056B2 | Advanced process control for new tapeout product | Emerging Cross-Sectional Technologies | 1 | Active |
| US8219341B2 | System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) with routing model | Electricity | 1 | Active |
| US7951615B2 | System and method for implementing multi-resolution advanced process control | Emerging Cross-Sectional Technologies | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.