Anthony Oates
12Patents
5h-index
19Co-inventors
63Inventor score
Filing activity: Apr 3, 1992 → Sep 26, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5264377A | Integrated circuit electromigration monitor | Electricity | 41 | Expired |
| US6198301A | Method for determining the hot carrier lifetime of a transistor | Electricity | 15 | Expired |
| US7471539B2 | High current interconnect structure for IC memory device programming | Electricity | 14 | Active |
| US6187665A | Process for deuterium passivation and hot carrier immunity | Electricity | 13 | Expired |
| US7768099B2 | MIM capacitor integrated into the damascene structure and method of making thereof | Electricity | 5 | Active |
| US8018000B2 | Electrostatic discharge protection pattern for high voltage applications | Electricity | 4 | Active |
| US6365503B1 | Method of improving electromigration in semiconductor device manufacturing processes | Electricity | 3 | Expired |
| US9818694B2 | Active atomic reservoir for enhancing electromigration reliability in integrated circuits | Electricity | 2 | Active |
| US6674151B1 | Deuterium passivated semiconductor device having enhanced immunity to hot carrier effects | Electricity | 1 | Expired |
| US7462885B2 | ESD structure for high voltage ESD protection | Electricity | 0 | Active |
| US10652032B2 | Device signature generation | Physics | 0 | Active |
| US11073428B2 | Conductive line-based temperature-sensing device | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.