Blake Erickson
18Patents
1h-index
26Co-inventors
50Inventor score
Filing activity: Jul 30, 2010 → Jul 9, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| USD977504S1 | Portion of a display panel with a graphical user interface | General | 8 | Active |
| US12283503B2 | Substrate measurement subsystem | Emerging Cross-Sectional Technologies | 1 | Active |
| US11668602B2 | Spatial optical emission spectroscopy for etch uniformity | Physics | 1 | Active |
| US11284018B1 | Smart camera substrate | Electricity | 1 | Active |
| US11830779B2 | In-situ etch material selectivity detection system | Electricity | 0 | Active |
| US12080574B2 | Low open area and coupon endpoint detection | Electricity | 0 | Active |
| US11736818B2 | Smart camera substrate | Electricity | 0 | Active |
| US12405164B2 | Spatial optical emission spectroscopy for etch uniformity | Physics | 0 | Active |
| US12191176B2 | Integrated substrate measurement system to improve manufacturing process performance | Emerging Cross-Sectional Technologies | 0 | Active |
| US12432461B2 | Smart camera substrate | Electricity | 0 | Active |
| US12031910B2 | Transmission corrected plasma emission using in-situ optical reflectometry | Physics | 0 | Active |
| US8568692B2 | Method for analyzing collagenous tissues for the detection and diagnosis of bone disease | Physics | 0 | Active |
| US11619594B2 | Multiple reflectometry for measuring etch parameters | Electricity | 0 | Active |
| US12009191B2 | Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wall | Electricity | 0 | Active |
| US11927543B2 | Multiple reflectometry for measuring etch parameters | Electricity | 0 | Active |
| US12136557B2 | Integrated substrate measurement system to improve manufacturing process performance | General | 0 | Revoked |
| US12114083B2 | Smart camera substrate | Electricity | 0 | Active |
| US11688616B2 | Integrated substrate measurement system to improve manufacturing process performance | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.