Bo Ching Jiang
23Patents
4h-index
29Co-inventors
63Inventor score
Filing activity: May 29, 2003 → Feb 24, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7026647B2 | Device and method for detecting alignment of active areas and memory cell structures in DRAM devices | Physics | 9 | Expired |
| US6902942B2 | Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices | Electricity | 7 | Expired |
| US6693834B1 | Device and method for detecting alignment of bit lines and bit line contacts in DRAM devices | Physics | 6 | Expired |
| US6891216B1 | Test structure of DRAM | Electricity | 6 | Expired |
| US6946678B2 | Test key for validating the position of a word line overlaying a trench capacitor in DRAMs | Electricity | 2 | Expired |
| US7381575B2 | Device and method for detecting alignment of active areas and memory cell structures in DRAM devices | Physics | 2 | Active |
| US6875654B2 | Memory device and fabrication method thereof | Electricity | 2 | Expired |
| US7217581B2 | Misalignment test structure and method thereof | Electricity | 2 | Expired |
| US7015050B2 | Misalignment test structure and method thereof | Electricity | 2 | Expired |
| US6984534B2 | Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal | Physics | 1 | Expired |
| US6812487B1 | Test key and method for validating the doping concentration of buried layers within a deep trench capacitors | Physics | 1 | Expired |
| US6844207B2 | Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal | Physics | 1 | Expired |
| US6838296B2 | Device and method for detecting alignment of deep trench capacitors and active areas in DRAM devices | Physics | 1 | Expired |
| US12261493B2 | Motor, compressor, and refrigeration device | Electricity | 0 | Active |
| US12123632B2 | Compressor and refrigeration device | Mechanical Engineering; Lighting; Heating | 0 | Active |
| US6825053B2 | Test key and method for validating the position of a word line overlaying a trench capacitor in DRAMS | Electricity | 0 | Expired |
| US11867439B2 | Stator assembly, electronic expansion valve and refrigeration device | Emerging Cross-Sectional Technologies | 0 | Active |
| US12299517B2 | Communication tag and electronic device | Physics | 0 | Active |
| US12085076B2 | Scroll structure and compressor with back pressure plate and floating plate | Mechanical Engineering; Lighting; Heating | 0 | Active |
| US12199473B2 | Rotor, motor, compressor, and refrigeration apparatus | Emerging Cross-Sectional Technologies | 0 | Active |
| US7091545B2 | Memory device and fabrication method thereof | Electricity | 0 | Expired |
| US12129930B2 | Nut, electronic expansion valve and stop structure thereof, and refrigeration device | Emerging Cross-Sectional Technologies | 0 | Active |
| US6790735B2 | Method of forming source/drain regions in semiconductor devices | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.