Carl Galewski
26Patents
14h-index
17Co-inventors
78Inventor score
Filing activity: Feb 25, 1992 → Mar 12, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6503330B1 | Apparatus and method to achieve continuous interface and ultrathin film during atomic layer deposition | Chemistry; Metallurgy | 463 | Expired |
| US6540838B2 | Apparatus and concept for minimizing parasitic chemical vapor deposition during atomic layer deposition | Electricity | 391 | Expired |
| US6305314A | Apparatus and concept for minimizing parasitic chemical vapor deposition during atomic layer deposition | Electricity | 363 | Expired |
| US6174377A | Processing chamber for atomic layer deposition processes | Electricity | 353 | Expired |
| US6451119B2 | Apparatus and concept for minimizing parasitic chemical vapor deposition during atomic layer deposition | Electricity | 251 | Expired |
| US6368954B1 | Method of copper interconnect formation using atomic layer copper deposition | Electricity | 199 | Expired |
| US5855675A | Multipurpose processing chamber for chemical vapor deposition processes | Electricity | 131 | Expired |
| US6638859B2 | Apparatus and method to achieve continuous interface and ultrathin film during atomic layer deposition | Chemistry; Metallurgy | 117 | Expired |
| US5324684A | Gas phase doping of semiconductor material in a cold-wall radiantly heated reactor under reduced pressure | Emerging Cross-Sectional Technologies | 80 | Expired |
| US6387185B1 | Processing chamber for atomic layer deposition processes | Electricity | 70 | Expired |
| US6479902B1 | Semiconductor catalytic layer and atomic layer deposition thereof | Electricity | 59 | Expired |
| US6818067B2 | Processing chamber for atomic layer deposition processes | Electricity | 50 | Expired |
| US8697197B2 | Methods for plasma processing | Electricity | 29 | Active |
| US6897119B1 | Apparatus and method to achieve continuous interface and ultrathin film during atomic layer deposition | Chemistry; Metallurgy | 19 | Expired |
| US6538327B1 | Method of copper interconnect formation using atomic layer copper deposition and a device thereby formed | Electricity | 9 | Expired |
| US6635570B1 | PECVD and CVD processes for WNx deposition | Electricity | 3 | Expired |
| US9299956B2 | Method for deposition of high-performance coatings and encapsulated electronic devices | Electricity | 2 | Active |
| US9443702B2 | Methods for plasma processing | Electricity | 2 | Active |
| US9096933B2 | Methods for plasma processing | Electricity | 2 | Active |
| US10526708B2 | Methods for forming thin protective and optical layers on substrates | Electricity | 1 | Active |
| US9096932B2 | Methods for plasma processing | Electricity | 1 | Active |
| US8765232B2 | Apparatus and method for dielectric deposition | Electricity | 1 | Active |
| US10049859B2 | Plasma generating units for processing a substrate | Electricity | 1 | Active |
| US9359674B2 | Apparatus and method for dielectric deposition | Electricity | 0 | Active |
| US9831466B2 | Method for depositing a multi-layer moisture barrier on electronic devices and electronic devices protected by a multi-layer moisture barrier | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.