Ching-Chiun Wang
17Patents
3h-index
30Co-inventors
56Inventor score
Filing activity: Nov 29, 2005 → Dec 9, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8362454B2 | Resistive random access memory having metal oxide layer with oxygen vacancies and method for fabricating the same | Electricity | 15 | Active |
| US7700988B2 | Metal-insulator-metal capacitor | Electricity | 9 | Active |
| US8672501B2 | Mirror device with illumination and mirror box using the same | Mechanical Engineering; Lighting; Heating | 4 | Active |
| US8124954B2 | Conductive bridging random access memory device and method of manufacturing the same | Electricity | 3 | Active |
| US7683374B2 | Silicon based photodetector | Emerging Cross-Sectional Technologies | 3 | Active |
| US7799653B2 | Method for forming capacitor in dynamic random access memory | Electricity | 3 | Active |
| US8896135B2 | Encapsulation film, package structure utilizing the same, and method for forming the package structure | Emerging Cross-Sectional Technologies | 3 | Active |
| US9957607B2 | Evaporation method | Chemistry; Metallurgy | 2 | Active |
| US10458019B2 | Film deposition apparatus having a peripheral spiral gas curtain | Chemistry; Metallurgy | 1 | Active |
| US7880213B2 | Bottom electrode of metal-insulator-metal capacitor | Electricity | 1 | Active |
| US9142776B2 | Resistive random access memory and method for fabricating the same | Electricity | 1 | Active |
| US7781298B2 | Methods for fabricating a capacitor | Electricity | 0 | Active |
| US11680316B2 | Deposition apparatus | Chemistry; Metallurgy | 0 | Active |
| US9373789B2 | Resistive random access memory and method for fabricating the same | Electricity | 0 | Active |
| US11320449B2 | Visualization device and observation method for flow field | Physics | 0 | Active |
| US7405122B2 | Methods for fabricating a capacitor | Electricity | 0 | Active |
| US11961716B2 | Atomic layer deposition method | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.