Doowon Kwon
13Patents
3h-index
20Co-inventors
56Inventor score
Filing activity: Jan 29, 2007 → Apr 15, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8415189B2 | Methods of fabricating image sensors including impurity layer isolation regions | Electricity | 11 | Active |
| US9780136B2 | Composite wafer semiconductor devices using offset via arrangements and methods of fabricating the same | Electricity | 9 | Active |
| US7586170B2 | Image sensors including impurity layer adjacent isolation region | Electricity | 3 | Active |
| US9711554B2 | Image sensor | Electricity | 2 | Active |
| US10199355B2 | Semiconductor devices including stacked semiconductor chips | Electricity | 2 | Active |
| US10483243B2 | Semiconductor devices including stacked semiconductor chips | Electricity | 1 | Active |
| US10930685B2 | Image sensor including a shield structure | Electricity | 1 | Active |
| US9859321B2 | Stack-type semiconductor device | Electricity | 1 | Active |
| US11183526B2 | Image sensor | Electricity | 0 | Active |
| US11776982B2 | Image sensor chip | Electricity | 0 | Active |
| US11652130B2 | Image sensor and manufacturing method of the same | Electricity | 0 | Active |
| US11393864B2 | Image sensor | Electricity | 0 | Active |
| US12364047B2 | Image sensor and method of manufacturing the same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.