Inventor · Tualatin, OR, US

Eugene Smargiassi

19Patents
11h-index
28Co-inventors
72Inventor score

Filing activity: Oct 15, 1998 → Jul 6, 2018

Most-cited inventions

PatentTitleAreaCited byStatus
US7935940B1 Measuring in-situ UV intensity in UV cure tool Electricity 542 Active
US6535628B2 Detection of wafer fragments in a wafer processing apparatus Physics 44 Expired
US6231716A Processing chamber with rapid wafer exchange Emerging Cross-Sectional Technologies 38 Expired
US8454750B1 Multi-station sequential curing of dielectric films Electricity 29 Active
US8282768B1 Purging of porogen from UV cure chamber Electricity 22 Active
US8629068B1 Multi-station sequential curing of dielectric films Electricity 21 Active
US8283644B2 Measuring in-situ UV intensity in UV cure tool Electricity 19 Active
US6515261B1 Enhanced lift pin Chemistry; Metallurgy 16 Expired
US8980769B1 Multi-station sequential curing of dielectric films Electricity 15 Active
US8734663B2 Purging of porogen from UV cure chamber Electricity 13 Active
US8518210B2 Purging of porogen from UV cure chamber Electricity 12 Active
US9073100B2 Method and apparatuses for reducing porogen accumulation from a UV-cure chamber Electricity 7 Active
US6807972B2 Gutter and splash-guard for protecting a wafer during transfer from a single wafer cleaning chamber Emerging Cross-Sectional Technologies 7 Expired
US9384959B2 Purging of porogen from UV cure chamber Electricity 6 Active
US9873946B2 Multi-station sequential curing of dielectric films Electricity 3 Active
US10020197B2 Method for reducing porogen accumulation from a UV-cure chamber Electricity 2 Active
US10121682B2 Purging of porogen from UV cure chamber Electricity 2 Active
US10240236B2 Clean resistant windows for ultraviolet thermal processing Performing Operations; Transporting 0 Active
US11177131B2 Method and apparatuses for reducing porogen accumulation from a UV-cure chamber Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.