Igor Petrov
20Patents
7h-index
29Co-inventors
69Inventor score
Filing activity: Jan 1, 2000 → Apr 28, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6380546B1 | Focusing assembly and method for a charged particle beam column | Electricity | 21 | Expired |
| US6674075B2 | Charged particle beam apparatus and method for inspecting samples | Electricity | 17 | Expired |
| US7067807B2 | Charged particle beam column and method of its operation | Electricity | 16 | Expired |
| US7034297B2 | Method and system for use in the monitoring of samples with a charged particle beam | Electricity | 11 | Expired |
| US6897442B2 | Objective lens arrangement for use in a charged particle beam column | Electricity | 10 | Expired |
| US7223974B2 | Charged particle beam column and method for directing a charged particle beam | Electricity | 9 | Expired |
| US6825475B2 | Deflection method and system for use in a charged particle beam column | Electricity | 8 | Expired |
| US7233008B1 | Multiple electrode lens arrangement and a method for inspecting an object | Physics | 7 | Expired |
| US8389584B2 | Nanodiamond material, method and device for purifying and modifying a nanodiamond | Emerging Cross-Sectional Technologies | 6 | Active |
| US9348622B2 | Method for targeted resource virtualization in containers | Physics | 6 | Active |
| US7112803B2 | Beam directing system and method for use in a charged particle beam column | Electricity | 5 | Expired |
| US7170068B2 | Method and system for discharging a sample | Electricity | 4 | Expired |
| US7800062B2 | Method and system for the examination of specimen | Electricity | 4 | Active |
| US7317606B2 | Particle trap for electrostatic chuck | Electricity | 3 | Expired |
| US10007537B2 | Method for targeted resource virtualization in containers | Physics | 3 | Active |
| US10074513B2 | Multi mode systems with retractable detectors | Electricity | 1 | Active |
| US7525091B2 | Charged particle beam system and a method for inspecting a sample | Electricity | 1 | Active |
| US11626267B2 | Back-scatter electrons (BSE) imaging with a SEM in tilted mode using cap bias voltage | Electricity | 0 | Active |
| US11264198B2 | Objective lens arrangement | Electricity | 0 | Active |
| US9431210B2 | Charged particle beam device with dynamic focus and method of operating thereof | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.