John Foster
22Patents
7h-index
32Co-inventors
69Inventor score
Filing activity: Jul 15, 1983 → Jun 24, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7565820B2 | Methods and apparatus for forming heat treated optical fiber | Emerging Cross-Sectional Technologies | 70 | Expired |
| US4704949A | Piston | Mechanical Engineering; Lighting; Heating | 14 | Expired |
| US5551215A | Bag and method of opening a bag with partial offset lip | Performing Operations; Transporting | 14 | Expired |
| US5692360A | System and method for packaging products | Performing Operations; Transporting | 11 | Expired |
| US5137541A | Polishing compounds and methods | Chemistry; Metallurgy | 11 | Expired |
| US8298505B2 | Process for gas sweetening | Performing Operations; Transporting | 10 | Active |
| US8314022B1 | Method for etching gate stack | Electricity | 7 | Active |
| US9330937B2 | Etching of semiconductor structures that include titanium-based layers | Electricity | 5 | Active |
| US8716146B2 | Low temperature etching of silicon nitride structures using phosphoric acid solutions | Electricity | 4 | Active |
| US6306707A | Double layer hard mask process to improve oxide quality for non-volatile flash memory products | Electricity | 4 | Expired |
| US7597198B1 | Novelty kit | Human Necessities | 2 | Active |
| US8735302B2 | High productivity combinatorial oxide terracing and PVD/ALD metal deposition combined with lithography for gate work function extraction | Electricity | 2 | Active |
| US8513117B2 | Process to remove Ni and Pt residues for NiPtSi applications | Electricity | 1 | Active |
| US7916067B2 | Removing clutter from radar cross section measurements using spectral tagging | Electricity | 1 | Active |
| US8945952B2 | High productivity combinatorial workflow for post gate etch clean development | Electricity | 1 | Active |
| US8859431B2 | Process to remove Ni and Pt residues for NiPtSi application using chlorine gas | Electricity | 0 | Active |
| US8466058B2 | Process to remove Ni and Pt residues for NiPtSi applications using chlorine gas | Electricity | 0 | Active |
| US8144050B1 | Removing clutter from radar cross section measurements using spectral tagging | Electricity | 0 | Active |
| US8575016B1 | Method for etching gate stack | Electricity | 0 | Active |
| US8603837B1 | High productivity combinatorial workflow for post gate etch clean development | Electricity | 0 | Active |
| US9831100B2 | Solution based etching of titanium carbide and titanium nitride structures | Electricity | 0 | Active |
| US8854067B2 | Circular transmission line methods compatible with combinatorial processing of semiconductors | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.