John Pierce
14Patents
7h-index
12Co-inventors
63Inventor score
Filing activity: May 6, 1986 → Nov 3, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6524885B2 | Method, apparatus and system for building an interposer onto a semiconductor wafer using laser techniques | Emerging Cross-Sectional Technologies | 59 | Expired |
| US4837447A | Rasterization system for converting polygonal pattern data into a bit-map | Electricity | 57 | Expired |
| US6529022B2 | Wafer testing interposer for a conventional package | Emerging Cross-Sectional Technologies | 31 | Expired |
| US6440771B1 | Method for constructing a wafer interposer by using conductive columns | Electricity | 18 | Expired |
| US6673653B2 | Wafer-interposer using a ceramic substrate | Electricity | 17 | Expired |
| US8904321B1 | System and method for automatically generating coverage constructs and constraint solver distributions | Physics | 12 | Active |
| US6933617B2 | Wafer interposer assembly | Emerging Cross-Sectional Technologies | 8 | Expired |
| US9373077B1 | System and method for identifying constraint solver calls | Physics | 5 | Active |
| US9202004B1 | System, method, and computer program product for ensuring that each simulation in a regression is running a unique configuration | Physics | 3 | Active |
| US7036218B2 | Method for producing a wafer interposer for use in a wafer interposer assembly | Emerging Cross-Sectional Technologies | 2 | Expired |
| US9619597B1 | System, method, and computer program product for electronic design configuration space determination and verification | Physics | 1 | Active |
| US9477800B1 | System, method, and computer program product for automatically selecting a constraint solver algorithm in a design verification environment | Physics | 0 | Active |
| US12135966B2 | Configuration-driven applications | Physics | 0 | Active |
| US11842187B2 | Configuration-driven applications | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.