Joseph Ku
22Patents
10h-index
25Co-inventors
71Inventor score
Filing activity: Jan 26, 1998 → Mar 12, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8631247B2 | System and method for hardware based security | Electricity | 108 | Active |
| US7183924B1 | Storing configuration information and a service record for an item in an RFID tag | Physics | 98 | Expired |
| US6351172B1 | High-speed output driver with an impedance adjustment scheme | Electricity | 53 | Expired |
| US6492854B1 | Power efficient and high performance flip-flop | Electricity | 29 | Expired |
| US7432816B1 | Printed circuit board with RFID antenna | Electricity | 23 | Expired |
| US6384331B1 | Secured reinforcing support device for a heat sink | Electricity | 18 | Expired |
| US6347029B1 | Over-current protection circuit for linear voltage regulators | Physics | 16 | Expired |
| US6907534B2 | Minimizing power consumption in pipelined circuit by shutting down pipelined circuit in response to predetermined period of time having expired | Physics | 13 | Expired |
| US6910155B2 | System and method for chip testing | Physics | 12 | Expired |
| US8606206B1 | Traveling wave beamforming network | Electricity | 10 | Active |
| US6145062A | Selective conflict write flush | Physics | 10 | Expired |
| US6874014B2 | Chip multiprocessor with multiple operating systems | Emerging Cross-Sectional Technologies | 6 | Expired |
| US6600328B2 | Analog method and circuit for monitoring digital events performance | Physics | 5 | Expired |
| US6940770B2 | Method for precharging word and bit lines for selecting memory cells within a memory array | Physics | 5 | Expired |
| US6851064B2 | Fine-grained thermal control in memory subsystems | Physics | 4 | Expired |
| US6982197B2 | Method and apparatus for building up large scale on chip de-coupling capacitor on standard CMOS/SOI technology | Electricity | 4 | Expired |
| US7087439B2 | Method and apparatus for thermally assisted testing of integrated circuits | Physics | 4 | Expired |
| US6886117B2 | Field repairable embedded memory in system-on-a-chip | Physics | 3 | Expired |
| US6889349B2 | Digital event sampling circuit and method | Electricity | 2 | Expired |
| US6826112B2 | Low power logic gate | Electricity | 2 | Expired |
| US6504746B2 | High-density low-cost read-only memory circuit | Electricity | 1 | Expired |
| US7248518B2 | Self-timed memory device providing adequate charging time for selected heaviest loading row | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.