Inventor · Arlington, MA, US

Kenneth B. Greiner

14Patents
7h-index
12Co-inventors
55Inventor score

Filing activity: Mar 14, 2013 → Sep 16, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US8832620B1 Rule checks in 3-D virtual fabrication environment Physics 15 Active
US8959464B2 Multi-etch process using material-specific behavioral parameters in 3-D virtual fabrication environment Electricity 12 Active
US9659126B2 Modeling pattern dependent effects for a 3-D virtual semiconductor fabrication environment Physics 10 Active
US9317632B2 System and method for modeling epitaxial growth in a 3-D virtual fabrication environment Physics 9 Active
US9965577B2 System and method for performing directed self-assembly in a 3-D virtual fabrication environment Physics 9 Active
US10242142B2 Predictive 3-D virtual fabrication system and method Emerging Cross-Sectional Technologies 8 Active
US11144701B2 System and method for key parameter identification, process model calibration and variability analysis in a virtual semiconductor device fabrication environment Physics 7 Active
US10762267B2 System and method for electrical behavior modeling in a 3D virtual fabrication environment Emerging Cross-Sectional Technologies 2 Active
US11861289B2 System and method for performing process model calibration in a virtual semiconductor device fabrication environment Physics 1 Active
US11074388B2 System and method for predictive 3-D virtual fabrication Emerging Cross-Sectional Technologies 0 Active
US11048847B2 System and method for performing a multi-etch process using material-specific behavioral parameters in a 3-D virtual fabrication environment Emerging Cross-Sectional Technologies 0 Active
US11630937B2 System and method for predictive 3-D virtual fabrication Emerging Cross-Sectional Technologies 0 Active
US12423486B2 System and method for process window optimization in a virtual semiconductor device fabrication environment Emerging Cross-Sectional Technologies 0 Active
US12086520B2 System and method for multi-material mesh generation from fill-fraction voxel data Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.