Kenneth D. Wagner
15Patents
9h-index
28Co-inventors
72Inventor score
Filing activity: Sep 29, 1992 → Dec 26, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5696771A | Method and apparatus for performing partial unscan and near full scan within design for test applications | Physics | 72 | Expired |
| US5612963A | Hybrid pattern self-testing of integrated circuits | Physics | 68 | Expired |
| US6067650A | Method and apparatus for performing partial unscan and near full scan within design for test applications | Physics | 38 | Expired |
| US6389566B1 | Edge-triggered scan flip-flop and one-pass scan synthesis methodology | Physics | 36 | Expired |
| US9922524B2 | Methods for detecting and handling fall and perimeter breach events for residents of an assisted living facility | Physics | 30 | Active |
| US6169418A | Efficient routing from multiple sources to embedded DRAM and other large circuit blocks | Electricity | 26 | Expired |
| US5633812A | Fault simulation of testing for board circuit failures | Physics | 24 | Expired |
| US6158033A | Multiple input signature testing & diagnosis for embedded blocks in integrated circuits | Physics | 19 | Expired |
| US5375091A | Method and apparatus for memory dynamic burn-in and test | Physics | 15 | Expired |
| US9779197B1 | Method and system of merging memory cells into multi-bit registers in an integrated circuit layout | Physics | 7 | Active |
| US8533546B1 | Reconfigurable scan chain connectivity to enable flexible device I/O utilization | Physics | 4 | Active |
| US9104825B1 | Method of reducing current leakage in a product variant of a semiconductor device | Electricity | 1 | Active |
| US10198927B2 | Methods for detecting and handling fall and perimeter breach events for residents of an assisted living facility | Physics | 1 | Active |
| US8843870B2 | Method of reducing current leakage in a device and a device thereby formed | Electricity | 0 | Active |
| US10607469B2 | Methods for detecting and handling fall and perimeter breach events for residents of an assisted living facility | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.