Kosuke Fujihara
8Patents
1h-index
8Co-inventors
33Inventor score
Filing activity: Mar 10, 2014 → Jan 31, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9829509B2 | Probe guide plate and semiconductor inspection apparatus | Physics | 1 | Active |
| US10309988B2 | Probe guide plate and probe device | Physics | 0 | Active |
| US9434604B2 | Cap, semiconductor device including the cap, and manufacturing method therefor | Emerging Cross-Sectional Technologies | 0 | Active |
| US10261110B2 | Probe guide plate having a silicon oxide layer formed on surfaces and on an inner wall of a through hole thereof, and a protective insulating layer formed on the silicon oxide layer, and probe apparatus including the probe guide plate | Physics | 0 | Active |
| US10386387B2 | Probe guide plate and probe device | Physics | 0 | Active |
| US10139430B2 | Probe guide, probe card, and method for probe guide manufacturing | Physics | 0 | Active |
| US9459287B2 | Guide plate for probe card | Physics | 0 | Active |
| US9523716B2 | Probe guide plate and method for manufacturing the same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.