Mark A. Beiley
27Patents
15h-index
25Co-inventors
77Inventor score
Filing activity: Apr 24, 1995 → Sep 24, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6040592A | Well to substrate photodiode for use in a CMOS sensor on a salicide process | Emerging Cross-Sectional Technologies | 73 | Expired |
| US6317154A | Method to reduce reset noise in photodiode based CMOS image sensors | Electricity | 54 | Expired |
| US5859450A | Dark current reducing guard ring | Electricity | 54 | Expired |
| US6433822B1 | Method and apparatus for self-calibration and fixed-pattern noise removal in imager integrated circuits | Electricity | 49 | Expired |
| US6133862A | Method and apparatus to reduce row reset noise in photodiode | Electricity | 36 | Expired |
| US6243134A | Method to reduce reset noise in photodiode based CMOS image sensors | Electricity | 36 | Expired |
| US6057586A | Method and apparatus for employing a light shield to modulate pixel color responsivity | Electricity | 35 | Expired |
| US6235549A | Method and apparatus for employing a light shield to modulate pixel color responsivity | Electricity | 33 | Expired |
| US6133563A | Sensor cell having a soft saturation circuit | Electricity | 30 | Expired |
| US6118482A | Method and apparatus for electrical test of CMOS pixel sensor arrays | Electricity | 30 | Expired |
| US6522357B2 | Method and apparatus for increasing retention time in image sensors having an electronic shutter | Electricity | 29 | Expired |
| US6157016A | Fast CMOS active-pixel sensor array readout circuit with predischarge circuit | Electricity | 27 | Expired |
| US6366320B1 | High speed readout architecture for analog storage arrays | Electricity | 20 | Expired |
| US5724295A | Partitioned dynamic memory allowing substitution of a redundant circuit in any partition and using partial address disablement and disablement override | Physics | 18 | Expired |
| US7024565B1 | Method and apparatus to detect circuit tampering | Electricity | 16 | Expired |
| US6438276B1 | Imaging system having a sensor array reset noise reduction mechanism | Electricity | 11 | Expired |
| US6933168B2 | Method and apparatus for employing a light shield to modulate pixel color responsivity | Electricity | 10 | Expired |
| US6806569B2 | Multi-frequency power delivery system | Electricity | 9 | Expired |
| US5939936A | Switchable N-well biasing technique for improved dynamic range and speed performance of analog data bus | Electricity | 7 | Expired |
| US6410359B1 | Reduced leakage trench isolation | Electricity | 6 | Expired |
| US6215165A | Reduced leakage trench isolation | Electricity | 5 | Expired |
| US7061224B2 | Test circuit for delay lock loops | Electricity | 5 | Expired |
| US5987577A | Dual word enable method and apparatus for memory arrays | Physics | 5 | Expired |
| US5708613A | High performance redundancy in an integrated memory system | Physics | 4 | Expired |
| US6362695B1 | Method and apparatus to produce a random bit sequence | Electricity | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.