Mark John Maslow
11Patents
2h-index
25Co-inventors
46Inventor score
Filing activity: May 27, 2016 → Aug 3, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10571806B2 | Method and system to monitor a process apparatus | Electricity | 4 | Active |
| US11379970B2 | Deep learning for semantic segmentation of pattern | Physics | 2 | Active |
| US11513442B2 | Method of determining control parameters of a device manufacturing process | Electricity | 1 | Active |
| US11520239B2 | Separation of contributions to metrology data | Physics | 0 | Active |
| US11847570B2 | Deep learning for semantic segmentation of pattern | Physics | 0 | Active |
| US12197136B2 | Method of determining control parameters of a device manufacturing process | Electricity | 0 | Active |
| US11860548B2 | Method for characterizing a manufacturing process of semiconductor devices | Physics | 0 | Active |
| US11768442B2 | Method of determining control parameters of a device manufacturing process | Electricity | 0 | Active |
| US10866523B2 | Process window tracker | Electricity | 0 | Active |
| US12332573B2 | Method for determining defectiveness of pattern based on after development image | Physics | 0 | Active |
| US11733610B2 | Method and system to monitor a process apparatus | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.