Mark Wagner
13Patents
2h-index
53Co-inventors
57Inventor score
Filing activity: Feb 19, 1998 → Feb 22, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9903711B2 | Feed forward of metrology data in a metrology system | Physics | 4 | Active |
| US6018314A | Method for obtaining PPS accuracy using an unclassified GPS receiver measurement interface | Physics | 2 | Expired |
| US9576861B2 | Method and system for universal target based inspection and metrology | Physics | 2 | Active |
| US10754260B2 | Method and system for process control with flexible sampling | Physics | 2 | Active |
| US9367877B1 | System for electronic administration of employee skill certification badge program | Physics | 2 | Active |
| US8160350B2 | Method and system for evaluating a variation in a parameter of a pattern | Physics | 2 | Active |
| US9806885B1 | Dual use cryptographic system and method | Electricity | 1 | Active |
| US9424636B2 | Method for measuring positions of structures on a mask and thereby determining mask manufacturing errors | Physics | 1 | Active |
| US9612541B2 | Qualifying patterns for microlithography | Physics | 1 | Active |
| US10685165B2 | Metrology using overlay and yield critical patterns | Emerging Cross-Sectional Technologies | 1 | Active |
| US10643286B2 | Knowledge management tool interface | Physics | 0 | Active |
| US10402461B2 | Virtual inspection systems for process window characterization | Physics | 0 | Active |
| US10217171B2 | System to administer insurance knowledge management tool | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.