Inventor · Birkenfeld, DE

Ralf Schneider

52Patents
8h-index
96Co-inventors
81Inventor score

Filing activity: May 22, 1981 → Jun 14, 2018

Most-cited inventions

PatentTitleAreaCited byStatus
US5786647A Device for incorporating a motor Mechanical Engineering; Lighting; Heating 39 Expired
US7459732B2 Gas-sensitive field-effect transistor with air gap Physics 23 Active
US6826111B2 On chip scrambling Physics 18 Expired
US7078835B2 Receptacle housing for mounting a fan motor to a carrier Electricity 15 Expired
US9089296B2 Illumination device and bottom unit, especially for medical diagnostic instruments Human Necessities 14 Active
US6365047B1 Method and device for treating biogenic residues Performing Operations; Transporting 12 Expired
US8017536B2 Component of quartz glass for use in semiconductor manufacture and method for producing the same Chemistry; Metallurgy 11 Active
US5201909A Liquid-cooled continuous casting mold Performing Operations; Transporting 11 Expired
US6530747B1 Balancing clip Emerging Cross-Sectional Technologies 8 Expired
US7068546B2 Integrated memory having a voltage generator circuit for generating a voltage supply for a read/write amplifier Physics 7 Expired
US7992426B2 Apparatus and method for increasing the selectivity of FET-based gas sensors Physics 7 Active
US7772617B2 Gas sensitive field-effect-transistor Physics 6 Active
US6797297B2 Indicating device and method for operating such a device Electricity 5 Expired
US4401296A Electro-metal smelting furnace with taphole arranged at the bottom Mechanical Engineering; Lighting; Heating 5 Expired
US6940775B2 Integrated dynamic memory having a control circuit for controlling a refresh mode for memory cells Physics 5 Expired
US7485228B2 Reactor and method for anaerobic wastewater treatment Emerging Cross-Sectional Technologies 4 Expired
US6927557B2 Voltage generator arrangement Physics 4 Expired
US6556486B2 Circuit configuration and method for synchronization Physics 3 Expired
US6898739B2 Method and device for testing a memory circuit Physics 3 Expired
US6906972B2 Integrated DRAM semiconductor memory and method for operating the same Physics 3 Expired
US7196537B2 Integrated circuit Physics 2 Expired
US7266027B2 Integrated semiconduct memory with test circuit Physics 2 Expired
US6754869B2 Method and device for testing set-up time and hold time of signals of a circuit with clocked data transfer Physics 2 Expired
US7365554B2 Integrated circuit for determining a voltage Physics 2 Expired
US7224627B2 Integrated semiconductor circuit and method for testing the same Physics 2 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.