Ramesh Gopalan
14Patents
2h-index
25Co-inventors
54Inventor score
Filing activity: Jun 28, 2002 → May 25, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11114326B2 | Substrate chucking and dechucking methods | Electricity | 2 | Active |
| US7413988B1 | Method and apparatus for detecting planarization of metal films prior to clearing | Electricity | 2 | Expired |
| US10685819B2 | Measuring concentrations of radicals in semiconductor processing | Physics | 2 | Active |
| US11373890B2 | Wireless in-situ real-time measurement of electrostatic chucking force in semiconductor wafer processing | Electricity | 1 | Active |
| US12033875B2 | Wireless in-situ real-time measurement of electrostatic chucking force in semiconductor wafer processing | Electricity | 0 | Active |
| US11047035B2 | Protective yttria coating for semiconductor equipment parts | Electricity | 0 | Active |
| US11521839B2 | Inline measurement of process gas dissociation using infrared absorption | Electricity | 0 | Active |
| US10415251B1 | Skylight with compound parabolic diffusers | Fixed Constructions | 0 | Active |
| US7690966B1 | Method and apparatus for detecting planarization of metal films prior to clearing | Electricity | 0 | Active |
| US10094788B2 | Surface acoustic wave sensors in semiconductor processing equipment | Electricity | 0 | Active |
| US7040952B1 | Method for reducing or eliminating de-lamination of semiconductor wafer film layers during a chemical mechanical planarization process | Performing Operations; Transporting | 0 | Expired |
| US10513008B2 | Chemical mechanical polishing smart ring | Electricity | 0 | Active |
| US10656100B2 | Surface acoustic wave sensors in semiconductor processing equipment | Electricity | 0 | Active |
| US11355325B2 | Methods and systems for monitoring input power for process control in semiconductor process systems | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.