Robert J. Rathert
11Patents
2h-index
17Co-inventors
43Inventor score
Filing activity: Apr 5, 2017 → Aug 17, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10761128B2 | Methods and systems for inline parts average testing and latent reliability defect detection | Emerging Cross-Sectional Technologies | 9 | Active |
| US11293970B2 | Advanced in-line part average testing | Physics | 3 | Active |
| US11614480B2 | System and method for Z-PAT defect-guided statistical outlier detection of semiconductor reliability failures | Electricity | 2 | Active |
| US10867877B2 | Targeted recall of semiconductor devices based on manufacturing data | Electricity | 1 | Active |
| US11624775B2 | Systems and methods for semiconductor defect-guided burn-in and system level tests | Electricity | 0 | Active |
| US12422376B2 | Imaging reflectometry for inline screening | Physics | 0 | Active |
| US12332182B2 | System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test data | Physics | 0 | Active |
| US11656274B2 | Systems and methods for evaluating the reliability of semiconductor die packages | Electricity | 0 | Active |
| US11754625B2 | System and method for identifying latent reliability defects in semiconductor devices | Physics | 0 | Active |
| US11798827B2 | Systems and methods for semiconductor adaptive testing using inline defect part average testing | Physics | 0 | Active |
| US11899065B2 | System and method to weight defects with co-located modeled faults | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.