Inventor · Burlington, VT, US

Ryan Wuthrich

20Patents
7h-index
45Co-inventors
65Inventor score

Filing activity: Jan 31, 1996 → Nov 22, 2006

Most-cited inventions

PatentTitleAreaCited byStatus
US6900519B2 Diffused extrinsic base and method for fabrication Electricity 96 Expired
US5874162A Weighted sintering process and conformable load tile Emerging Cross-Sectional Technologies 62 Expired
US6774000B2 Method of manufacture of MOSFET device with in-situ doped, raised source and drain structures Electricity 38 Expired
US6858532B2 Low defect pre-emitter and pre-base oxide etch for bipolar transistors and related tooling Electricity 31 Expired
US6875279B2 Single reactor, multi-pressure chemical vapor deposition for semiconductor devices Emerging Cross-Sectional Technologies 26 Expired
US6858903B2 MOSFET device with in-situ doped, raised source and drain structures Electricity 15 Expired
US6426265B1 Incorporation of carbon in silicon/silicon germanium epitaxial layer to enhance yield for Si-Ge bipolar technology Electricity 14 Expired
US6744079B2 Optimized blocking impurity placement for SiGe HBTs Electricity 7 Expired
US6354309B1 Process for treating a semiconductor substrate Electricity 5 Expired
US5741131A Stacking system for substrates Mechanical Engineering; Lighting; Heating 4 Expired
US6173720A Process for treating a semiconductor substrate Electricity 4 Expired
US5948193A Process for fabricating a multilayer ceramic substrate from thin greensheet Electricity 4 Expired
US6869854B2 Diffused extrinsic base and method for fabrication Electricity 3 Expired
US6780735B2 Method to increase carbon and boron doping concentrations in Si and SiGe films Electricity 3 Expired
US6815802B2 Incorporation of carbon in silicon/silicon germanium epitaxial layer to enhance yield for Si-Ge bipolar technology Electricity 3 Expired
US7118995B2 Yield improvement in silicon-germanium epitaxial growth Electricity 1 Expired
US7413967B2 Yield improvement in silicon-germanium epitaxial growth Electricity 1 Active
US7713829B2 Incorporation of carbon in silicon/silicon germanium epitaxial layer to enhance yield for Si-Ge bipolar technology Electricity 0 Active
US7173274B2 Incorporation of carbon in silicon/silicon germanium epitaxial layer to enhance yield for Si-Ge bipolar technology Electricity 0 Expired
US6881259B1 In-situ monitoring and control of germanium profile in silicon-germanium alloy films and temperature monitoring during deposition of silicon films Chemistry; Metallurgy 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.