Satoshi Tomimatsu
72Patents
16h-index
48Co-inventors
84Inventor score
Filing activity: Apr 22, 1997 → Feb 13, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6538254B1 | Method and apparatus for sample fabrication | Emerging Cross-Sectional Technologies | 175 | Expired |
| US6734687B1 | Apparatus for detecting defect in device and method of detecting defect | Physics | 113 | Expired |
| US8779400B2 | Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample | Electricity | 88 | Active |
| US6664552B2 | Method and apparatus for specimen fabrication | Electricity | 73 | Expired |
| US6781125B2 | Method and apparatus for processing a micro sample | Electricity | 63 | Expired |
| US6927391B2 | Method and apparatus for processing a micro sample | Electricity | 39 | Expired |
| US7071475B2 | Method and apparatus for specimen fabrication | Electricity | 39 | Expired |
| US6828566B2 | Method and apparatus for specimen fabrication | Electricity | 37 | Expired |
| US6583426B1 | Projection ion beam machining apparatus | Electricity | 32 | Expired |
| US6858851B2 | Apparatus for specimen fabrication and method for specimen fabrication | Electricity | 30 | Expired |
| US6960765B2 | Probe driving method, and probe apparatus | Physics | 28 | Expired |
| US7205554B2 | Method and apparatus for processing a micro sample | Electricity | 23 | Expired |
| US7205560B2 | Method and apparatus for processing a micro sample | Electricity | 21 | Expired |
| US7138628B2 | Method and apparatus for specimen fabrication | Electricity | 21 | Expired |
| US7550750B2 | Method and apparatus for processing a micro sample | Electricity | 18 | Active |
| US7465945B2 | Method and apparatus for processing a micro sample | Electricity | 17 | Active |
| US7268356B2 | Method and apparatus for specimen fabrication | Electricity | 16 | Expired |
| US6794663B2 | Method and apparatus for specimen fabrication | Electricity | 16 | Expired |
| US7470918B2 | Method and apparatus for processing a micro sample | Electricity | 15 | Active |
| US7700931B2 | Ion beam processing apparatus | Electricity | 13 | Active |
| US6627889B2 | Apparatus and method for observing sample using electron beam | Electricity | 12 | Expired |
| US7888639B2 | Method and apparatus for processing a micro sample | Electricity | 11 | Active |
| US8115184B2 | Gas field ion source, charged particle microscope, and apparatus | Electricity | 11 | Active |
| US8481980B2 | Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample | Electricity | 10 | Active |
| US7326942B2 | Ion beam system and machining method | Electricity | 10 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.