Shinichi Oki
18Patents
6h-index
17Co-inventors
63Inventor score
Filing activity: Sep 21, 1989 → Oct 7, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5605844A | Inspecting method for semiconductor devices | Electricity | 26 | Expired |
| US6229329A | Method of testing electrical characteristics of multiple semiconductor integrated circuits simultaneously | Physics | 25 | Expired |
| US4972489A | Sound reproducing apparatus | Electricity | 20 | Expired |
| US5829126A | Method of manufacturing probe card | Emerging Cross-Sectional Technologies | 18 | Expired |
| US6297658A | Wafer burn-in cassette and method of manufacturing probe card for use therein | Physics | 18 | Expired |
| US5665610A | Semiconductor device checking method | Physics | 6 | Expired |
| US6518779B1 | Probe card | Physics | 6 | Expired |
| US6781400B2 | Method of testing semiconductor integrated circuits and testing board for use therein | Physics | 2 | Expired |
| US6400175B2 | Method of testing semiconductor integrated circuits and testing board for use therein | Physics | 2 | Expired |
| US11032945B2 | Heat shield assembly for an epitaxy chamber | Electricity | 2 | Active |
| US10446420B2 | Upper cone for epitaxy chamber | Chemistry; Metallurgy | 1 | Active |
| US12165899B2 | Bipolar electrostatic chuck for etch chamber | Electricity | 1 | Active |
| US9879358B2 | Heat shield ring for high growth rate EPI chamber | Chemistry; Metallurgy | 1 | Active |
| US10544518B2 | Chamber components for epitaxial growth apparatus | Electricity | 1 | Active |
| US10704146B2 | Support assembly for substrate backside discoloration control | Chemistry; Metallurgy | 1 | Active |
| US10978324B2 | Upper cone for epitaxy chamber | Chemistry; Metallurgy | 0 | Active |
| US9680053B2 | Nitride semiconductor device | Electricity | 0 | Active |
| US11441236B2 | Chamber components for epitaxial growth apparatus | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.