Stefano Commodaro
13Patents
6h-index
14Co-inventors
55Inventor score
Filing activity: May 23, 1997 → Apr 26, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5946238A | Single-cell reference signal generating circuit for reading nonvolatile memory | Physics | 32 | Expired |
| US5955873A | Band-gap reference voltage generator | Emerging Cross-Sectional Technologies | 32 | Expired |
| US6031761A | Switching circuit having an output voltage varying between a reference voltage and a negative voltage | Physics | 21 | Expired |
| US6128225A | Method and circuit for reading low-supply-voltage nonvolatile memory cells | Physics | 16 | Expired |
| US6351413B1 | Nonvolatile memory device, in particular a flash-EEPROM | Physics | 12 | Expired |
| US5903498A | Low-supply-voltage nonvolatile memory device with voltage boosting | Physics | 11 | Expired |
| US6018255A | Line decoder for memory devices | Physics | 3 | Expired |
| US6094073A | Line decoder for memory devices | Physics | 3 | Expired |
| US7606692B2 | Gate-level netlist reduction for simulating target modules of a design | Physics | 3 | Expired |
| US6204722A | Electronic circuit for generating a stable voltage signal for polarizing during a reading step UPROM memory cells operating at low feed voltage | Physics | 1 | Expired |
| US6237104A | Method and a related circuit for adjusting the duration of a synchronization signal ATD for timing the access to a non-volatile memory | Physics | 1 | Expired |
| US6249172A | Circuit for discharging a negative potential node to ground, including control of the discharge current | Physics | 1 | Expired |
| US7168016B2 | Method and a device for testing electronic memory devices | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.