Inventor · Tainan, TW

Szu-Hung Yang

10Patents

4h-index

35Co-inventors

60Inventor score

Filing activity: Dec 28, 1998 → Jul 25, 2022

Most-cited inventions

Patent	Title	Area	Cited by	Status
US6682659B1	Method for forming corrosion inhibited conductor layer	Electricity	36	Expired
US9515021B1	Semiconductor structure and method of forming the same	Electricity	15	Active
US6686292B1	Plasma etch method for forming uniform linewidth residue free patterned composite silicon containing dielectric layer/silicon stack layer	Electricity	14	Expired
US8803271B2	Structures for grounding metal shields in backside illumination image sensor chips	Electricity	4	Active
US9040317B2	Methods for achieving width control in etching processes	Electricity	2	Active
US8872301B2	Dual profile shallow trench isolation apparatus and system	Electricity	2	Active
US10367019B2	CMOS image sensor structure with crosstalk improvement	Electricity	0	Active
US12227865B2	Plating apparatus and method for electroplating wafer	Electricity	0	Active
US11401624B2	Plating apparatus and method for electroplating wafer	Electricity	0	Active
US10957728B2	CMOS image sensor structure with crosstalk improvement	Electricity	0	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.