Inventor · Nagoya, JP

Toshio Yamada

168Patents
25h-index
213Co-inventors
93Inventor score

Filing activity: Aug 9, 1974 → Sep 28, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US5497079A Semiconductor testing apparatus, semiconductor testing circuit chip, and probe card Physics 101 Expired
US5945834A Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method Physics 100 Expired
US5514934A Discharge lamp, image display device using the same and discharge lamp producing method Electricity 85 Expired
US6005401A Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method Physics 84 Expired
US5910010A Semiconductor integrated circuit device, and process and apparatus for manufacturing the same Electricity 81 Expired
US5866079A Ceramic honeycomb catalytic converter Mechanical Engineering; Lighting; Heating 49 Expired
US4909419A Percussion tool Performing Operations; Transporting 47 Expired
US4749613A Composite fiber reinforced thermoplastic resin stampable sheet and bumper beam formed thereof Emerging Cross-Sectional Technologies 46 Expired
US5045637A Magnetic shielding material Performing Operations; Transporting 44 Expired
US5131579A Nailing machine Performing Operations; Transporting 43 Expired
US3945551A Nailing machine Performing Operations; Transporting 42 Expired
US4888732A Dynamic random access memory having open bit line architecture Physics 41 Expired
US5705491A Adenosine deaminase inhibitor Chemistry; Metallurgy 37 Expired
US5720787A Exhaust gas purifying filter using honeycomb monolith with random length sealing portions Emerging Cross-Sectional Technologies 35 Expired
US5375095A Semiconductor memory apparatus with reduced line widths Physics 34 Expired
US5666049A Semiconductor testing apparatus, semiconductor testing circuit chip, and probe card Physics 33 Expired
US5389810A Semiconductor device having at least one symmetrical pair of MOSFETs Electricity 32 Expired
US5592925A Exhaust gas recirculation device for internal combustion engine Mechanical Engineering; Lighting; Heating 31 Expired
US5140184A Clock feeding circuit and clock wiring system Physics 31 Expired
US5642323A Semiconductor integrated circuit with a data transmission circuit Physics 30 Expired
US5018000A Semiconductor device using MIS capacitor Electricity 29 Expired
US5494881A Ceramic honeycomb structural body and catalyst comprising the same Performing Operations; Transporting 26 Expired
US5892384A Timing signal generation circuit Electricity 26 Expired
US7008461B2 Honeycomb structure, method for manufacturing honeycomb structure, and exhaust gas purification system using honeycomb structure Emerging Cross-Sectional Technologies 26 Expired
US4807194A Seimiconductor memory device having sub bit lines Physics 25 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.