Upendra Ummethala
36Patents
8h-index
67Co-inventors
78Inventor score
Filing activity: Oct 2, 2002 → Jul 9, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8548678B2 | Active suspending | Performing Operations; Transporting | 93 | Active |
| US7962261B2 | Vehicle suspension | Performing Operations; Transporting | 87 | Active |
| US8938333B2 | Active wheel damping | Performing Operations; Transporting | 33 | Active |
| US9316667B2 | Accelerometer leveling in an actively controlled vehicle suspension | Physics | 31 | Active |
| US7983813B2 | Active suspending | Performing Operations; Transporting | 22 | Active |
| US8781681B2 | Active suspending | Performing Operations; Transporting | 19 | Active |
| US11114286B2 | In-situ optical chamber surface and process sensor | Electricity | 9 | Active |
| USD977504S1 | Portion of a display panel with a graphical user interface | General | 8 | Active |
| US11499869B2 | Optical wall and process sensor with plasma facing sensor | Electricity | 7 | Active |
| US6922301B1 | Positioner of a disk drive that positions a data transducer with reduced vibration | Physics | 4 | Expired |
| US9952253B2 | Accelerometer leveling in an actively controlled vehicle suspension | Physics | 3 | Active |
| US11784028B2 | Performing radio frequency matching control using a model-based digital twin | Electricity | 2 | Active |
| US9298106B1 | Wafer stage with reciprocating wafer stage actuation control | Electricity | 1 | Active |
| US11284018B1 | Smart camera substrate | Electricity | 1 | Active |
| US12283503B2 | Substrate measurement subsystem | Emerging Cross-Sectional Technologies | 1 | Active |
| US11009538B2 | Micro resonator array system | Electricity | 1 | Active |
| US11719952B2 | Adjustable achromatic collimator assembly for endpoint detection systems | Physics | 1 | Active |
| US11688616B2 | Integrated substrate measurement system to improve manufacturing process performance | Emerging Cross-Sectional Technologies | 0 | Active |
| US11486927B2 | Bode fingerprinting for characterizations and failure detections in processing chamber | Electricity | 0 | Active |
| US8724115B2 | Linear stage and metrology architecture for reflective electron beam lithography | Electricity | 0 | Active |
| US12136557B2 | Integrated substrate measurement system to improve manufacturing process performance | General | 0 | Revoked |
| US11693053B2 | Bode fingerprinting for characterizations and failure detections in processing chamber | Electricity | 0 | Active |
| US11735401B2 | In-situ optical chamber surface and process sensor | Electricity | 0 | Active |
| US10901021B2 | Method for detecting wafer processing parameters with micro resonator array sensors | Electricity | 0 | Active |
| US12114083B2 | Smart camera substrate | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.