Vicky Svidenko
11Patents
5h-index
22Co-inventors
62Inventor score
Filing activity: Jan 31, 2006 → Sep 1, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7760929B2 | Grouping systematic defects with feedback from electrical inspection | Physics | 35 | Active |
| US7937179B2 | Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects | Emerging Cross-Sectional Technologies | 15 | Active |
| US7760347B2 | Design-based method for grouping systematic defects in lithography pattern writing system | Physics | 12 | Active |
| US7962864B2 | Stage yield prediction | Physics | 8 | Active |
| US8049521B2 | Solar parametric testing module and processes | Emerging Cross-Sectional Technologies | 7 | Active |
| US8799831B2 | Inline defect analysis for sampling and SPC | Physics | 5 | Active |
| US8924904B2 | Method and apparatus for determining factors for design consideration in yield analysis | Physics | 1 | Active |
| US9843494B2 | Channel availability checks with device monitoring | Electricity | 1 | Active |
| US7956337B2 | Scribe process monitoring methodology | Emerging Cross-Sectional Technologies | 1 | Active |
| US7844101B2 | System and method for performing post-plating morphological Cu grain boundary analysis | Physics | 0 | Active |
| US8893308B2 | Counterfeit prevention for optical media | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.