Ya-Fen Lin
22Patents
6h-index
21Co-inventors
65Inventor score
Filing activity: Mar 9, 2004 → Feb 14, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7050316B1 | Differential non-volatile content addressable memory cell and array using phase changing resistor storage elements | Physics | 66 | Expired |
| US7403418B2 | Word line voltage boosting circuit and a memory array incorporating same | Physics | 35 | Expired |
| US7247907B2 | Bidirectional split gate NAND flash memory structure and array, method of programming, erasing and reading thereof, and method of manufacturing | Electricity | 14 | Expired |
| US8692310B2 | Gate fringing effect based channel formation for semiconductor device | Electricity | 7 | Active |
| US8638609B2 | Partial local self boosting for NAND | Physics | 6 | Active |
| US7544569B2 | Bidirectional split gate NAND flash memory structure and array, method of programming, erasing and reading thereof, and method of manufacturing | Electricity | 6 | Active |
| US7351613B2 | Method of trimming semiconductor elements with electrical resistance feedback | Electricity | 5 | Expired |
| US7242051B2 | Split gate NAND flash memory structure and array, method of programming, erasing and reading thereof, and method of manufacturing | Physics | 5 | Expired |
| US8780642B2 | Split gate NAND flash memory structure and array, method of programming, erasing and reading thereof, and method of manufacturing | Physics | 4 | Active |
| US7723774B2 | Non-diffusion junction split-gate nonvolatile memory cells and arrays, methods of programming, erasing, and reading thereof, and methods of manufacture | Electricity | 3 | Active |
| US9570458B2 | Gate fringing effect based channel formation for semiconductor device | Electricity | 3 | Active |
| US9449693B2 | Split gate NAND flash memory structure and array, method of programming, erasing and reading thereof, and method of manufacturing | Physics | 2 | Active |
| US7826267B2 | Method and apparatus for reading and programming a non-volatile memory cell in a virtual ground array | Physics | 2 | Active |
| US8164135B2 | Non-diffusion junction split-gate nonvolatile memory cells and arrays, methods of programming, erasing, and reading thereof, and methods of manufacture | Electricity | 2 | Active |
| US9514824B2 | Partial local self boosting for NAND | Physics | 1 | Active |
| US7848146B2 | Partial local self-boosting of a memory cell channel | Physics | 1 | Active |
| US11251189B2 | Gate fringing effect based channel formation for semiconductor device | Electricity | 0 | Active |
| US9892790B2 | Method of programming a continuous-channel flash memory device | Physics | 0 | Active |
| US7790518B2 | Method of trimming semiconductor elements with electrical resistance feedback | Electricity | 0 | Active |
| US7808839B2 | Split gate NAND flash memory structure and array, method of programming, erasing and reading thereof, and method of manufacturing | Physics | 0 | Active |
| US10297606B2 | Gate fringing effect based channel formation for semiconductor device | Electricity | 0 | Active |
| US11950412B2 | Gate fringing effect based channel formation for semiconductor device | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.