Yuri Tkachev
13Patents
5h-index
31Co-inventors
62Inventor score
Filing activity: Nov 13, 2009 → Jan 14, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7868375B2 | Split gate non-volatile flash memory cell having a floating gate, control gate, select gate and an erase gate with an overhang over the floating gate, array and method of manufacturing | Electricity | 138 | Active |
| US7927994B1 | Split gate non-volatile flash memory cell having a floating gate, control gate, select gate and an erase gate with an overhang over the floating gate, array and method of manufacturing | Electricity | 46 | Active |
| US8711636B2 | Method of operating a split gate flash memory cell with coupling gate | Electricity | 17 | Active |
| US9245638B2 | Method of operating a split gate flash memory cell with coupling gate | Electricity | 6 | Active |
| US9123822B2 | Split gate non-volatile flash memory cell having a silicon-metal floating gate and method of making same | Electricity | 5 | Active |
| US10714489B2 | Method of programming a split-gate flash memory cell with erase gate | Physics | 2 | Active |
| US9275748B2 | Low leakage, low threshold voltage, split-gate flash cell operation | Electricity | 2 | Active |
| US11018147B1 | Method of forming split gate memory cells with thinned tunnel oxide | Electricity | 2 | Active |
| US9466732B2 | Split-gate memory cell with depletion-mode floating gate channel, and method of making same | Electricity | 1 | Active |
| US9633735B2 | System and method to inhibit erasing of portion of sector of split gate flash memory cells | Physics | 1 | Active |
| US11362218B2 | Method of forming split gate memory cells with thinned side edge tunnel oxide | Electricity | 0 | Active |
| US12020762B2 | Method of determining defective die containing non-volatile memory cells | Physics | 0 | Active |
| US11393535B2 | Ultra-precise tuning of analog neural memory cells in a deep learning artificial neural network | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.