Hitachi Instruments Engineering Co., Ltd.
32Patents
0Active
32Granted
37Portfolio score
Filing activity: Oct 16, 1986 → Dec 16, 2002
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5789252A | Method of washing container used for reaction of body liquid sample and reagent | Emerging Cross-Sectional Technologies | 77 | Expired |
| US6542830B1 | Process control system | Electricity | 44 | Expired |
| US5270212A | Cell analysis apparatus | Emerging Cross-Sectional Technologies | 39 | Expired |
| US4737787A | Two-wire communication system | Electricity | 36 | Expired |
| US5903004A | Energy dispersive X-ray analyzer | Electricity | 33 | Expired |
| US5309106A | Magnetic field generator | Physics | 22 | Expired |
| US5008537A | Composite apparatus with secondary ion mass spectrometry instrument and scanning electron microscope | Electricity | 22 | Expired |
| US5047647A | Electron beam lithography apparatus | Electricity | 21 | Expired |
| US5684315A | Semiconductor memory device including memory cells each having an information storage capacitor component formed over control electrode of cell selecting transistor | Electricity | 20 | Expired |
| US4992661A | Method and apparatus for neutralizing an accumulated charge on a specimen by means of a conductive lattice deposited on the specimen | Electricity | 18 | Expired |
| US5278407A | Secondary-ion mass spectrometry apparatus using field limiting method | Electricity | 16 | Expired |
| US5670379A | Chromatograph system and method of use | Physics | 14 | Expired |
| US5424550A | Charged particle beam exposure apparatus | Electricity | 13 | Expired |
| US5898177A | Electron microscope | Electricity | 11 | Expired |
| US5236847A | Method for analyzing amino acids and apparatus therefor | Emerging Cross-Sectional Technologies | 10 | Expired |
| US5458003A | Electromagnetic flow meter | Physics | 10 | Expired |
| US5721942A | Personal information display system for serving large capacities of general information to user-designated stations at user-designated times | Physics | 9 | Expired |
| US6529836B2 | Data processing apparatus for chromatograph | Physics | 8 | Expired |
| US5378630A | Test strip automatic supply device and analytical instrument using the same | Emerging Cross-Sectional Technologies | 8 | Expired |
| US5185523A | Mass spectrometer for analyzing ultra trace element using plasma ion source | Electricity | 8 | Expired |
| US5296669A | Specimen heating device for use with an electron microscope | Electricity | 7 | Expired |
| US5471141A | Method and apparatus for regulating radio frequency pulse | Physics | 7 | Expired |
| US6314374A | Data processing apparatus for chromatograph | Physics | 6 | Expired |
| US5384466A | Electron beam lithography apparatus and a method thereof | Electricity | 5 | Expired |
| US5368727A | Liquid chromatograph mass spectrometer | Electricity | 4 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.