Patent assignee · US · COMPANY

Integrated Magnetoelectronics Corp.

21Patents
8Active
21Granted
41Portfolio score

Filing activity: Apr 30, 1997 → Jul 21, 2020 · 2 expiring within 5 years

Most-cited patents

PatentTitleAreaCited byStatus
US6031273A All-metal, giant magnetoresistive, solid-state component Electricity 67 Expired
US5929636A All-metal giant magnetoresistive solid-state component Electricity 38 Expired
US6483740B2 All metal giant magnetoresistive memory Physics 36 Expired
US6469927B2 Magnetoresistive trimming of GMR circuits Emerging Cross-Sectional Technologies 29 Expired
US6573713B2 Transpinnor-based switch and applications Electricity 18 Expired
US6594175B2 High density giant magnetoresistive memory cell Physics 14 Expired
US6859063B2 Transpinnor-based transmission line transceivers and applications Electricity 13 Expired
US6992919B2 All-metal three-dimensional circuits and memories Physics 13 Expired
US7220968B2 Radiation detector having all-metal circuitry operation of which is based on electron spin Physics 12 Expired
US6538437B2 Low power magnetic anomaly sensor Physics 11 Expired
US7005852B2 Displays with all-metal electronics Physics 9 Expired
US6738284B2 Transpinnor-based sample-and-hold circuit and applications Electricity 8 Expired
US7224566B2 Interfaces between semiconductor circuitry and transpinnor-based circuitry Electricity 7 Expired
US7911830B2 Scalable nonvolatile memory Emerging Cross-Sectional Technologies 7 Active
US8300455B2 Scalable nonvolatile memory Emerging Cross-Sectional Technologies 6 Active
US8619467B2 High GMR structure with low drive fields Emerging Cross-Sectional Technologies 5 Active
US10170171B2 3D spinram Physics 3 Active
US9741923B2 SpinRAM Physics 3 Active
US10762940B2 Narrow etched gaps or features in multi-period thin-film structures Physics 1 Active
US11222676B2 Narrow etched gaps or features in multi-period thin-film structures Physics 0 Active
USRE48879E1 Spinram General 0 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.