Bert Henning Freitag
18Patents
5h-index
26Co-inventors
62Inventor score
Filing activity: Aug 30, 2006 → Oct 12, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8080791B2 | X-ray detector for electron microscope | Electricity | 17 | Active |
| US7825378B2 | Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus | Electricity | 12 | Active |
| US7518121B2 | Method for determining lens errors in a particle-optical device | Electricity | 9 | Active |
| US8410439B2 | X-ray detector for electron microscope | Electricity | 8 | Active |
| US10224174B1 | Transmission charged particle microscope with imaging beam rotation | Electricity | 7 | Active |
| US8405027B2 | Contrast for scanning confocal electron microscope | Electricity | 5 | Active |
| US8168948B2 | Method of machining a work piece with a focused particle beam | Electricity | 4 | Active |
| US8592764B2 | X-ray detector for electron microscope | Electricity | 3 | Active |
| US8389936B2 | Method for inspecting a sample | Electricity | 2 | Active |
| US8859966B2 | Simultaneous electron detection | Electricity | 1 | Active |
| US8993963B2 | Mounting structures for multi-detector electron microscopes | Electricity | 1 | Active |
| US11127562B1 | System and method for RF pulsed electron beam based STEM | Electricity | 1 | Active |
| US11488800B2 | Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging | Electricity | 1 | Active |
| US12288667B2 | Live-assisted image acquisition method and system with charged particle microscopy | Electricity | 0 | Active |
| US11741730B2 | Charged particle microscope scan masking for three-dimensional reconstruction | Electricity | 0 | Active |
| US12136532B2 | Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging | Electricity | 0 | Active |
| US10832901B2 | EELS detection technique in an electron microscope | Electricity | 0 | Active |
| US11211223B1 | System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.