Chang Ke
15Patents
1h-index
31Co-inventors
50Inventor score
Filing activity: May 1, 2014 → Oct 24, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10643840B2 | Selective deposition defects removal by chemical etch | Electricity | 2 | Active |
| US11815436B2 | Detection of surface particles on chamber components with carbon dioxide | Physics | 1 | Active |
| US11441974B2 | Detection of surface particles on chamber components with carbon dioxide | Physics | 1 | Active |
| US12169163B2 | Detection of surface particles on chamber components with carbon dioxide | Physics | 0 | Active |
| US10770292B2 | Wafer treatment for achieving defect-free self-assembled monolayers | Electricity | 0 | Active |
| US11194244B2 | Extreme ultraviolet mask absorber and processes for manufacture | Physics | 0 | Active |
| US11735420B2 | Wafer treatment for achieving defect-free self-assembled monolayers | Electricity | 0 | Active |
| US12024770B2 | Methods for selective deposition using self-assembled monolayers | Performing Operations; Transporting | 0 | Active |
| US11508610B2 | Substrate support with edge seal | Electricity | 0 | Active |
| US9274570B2 | Positioning apparatus for expansion card | Physics | 0 | Active |
| US12313180B2 | Gas flow valve and methods of operating thereof | Emerging Cross-Sectional Technologies | 0 | Active |
| US11033930B2 | Methods and apparatus for cryogenic gas stream assisted SAM-based selective deposition | Performing Operations; Transporting | 0 | Active |
| US10892161B2 | Enhanced selective deposition process | Electricity | 0 | Active |
| US10950433B2 | Methods for enhancing selectivity in SAM-based selective deposition | Electricity | 0 | Active |
| US11515155B2 | Methods for enhancing selectivity in SAM-based selective deposition | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.