Inventor · Singapore, SG

Chee Peng Neo

17Patents
6h-index
12Co-inventors
59Inventor score

Filing activity: Aug 30, 2001 → Apr 26, 2011

Most-cited inventions

PatentTitleAreaCited byStatus
US7309623B2 Method of fabricating a stacked die in die BGA package Electricity 34 Active
US7282390B2 Stacked die-in-die BGA package with die having a recess Electricity 12 Expired
US7344969B2 Stacked die in die BGA package Electricity 8 Expired
US6779386B2 Method and apparatus for detecting topographical features of microelectronic substrates Emerging Cross-Sectional Technologies 8 Expired
US7332819B2 Stacked die in die BGA package Electricity 7 Expired
US7332820B2 Stacked die in die BGA package Electricity 7 Expired
US7371608B2 Method of fabricating a stacked die having a recess in a die BGA package Electricity 6 Expired
US6923045B2 Method and apparatus for detecting topographical features of microelectronic substrates Emerging Cross-Sectional Technologies 5 Expired
US8373277B2 Stacked die in die BGA package Electricity 4 Active
US7799610B2 Method of fabricating a stacked die having a recess in a die BGA package Electricity 4 Active
US7282392B2 Method of fabricating a stacked die in die BGA package Electricity 3 Active
US7575953B2 Stacked die with a recess in a die BGA package Electricity 3 Active
US7358117B2 Stacked die in die BGA package Electricity 3 Active
US8011513B2 Semiconductor workpiece carriers and methods for processing semiconductor workpieces Emerging Cross-Sectional Technologies 1 Active
US7213447B2 Method and apparatus for detecting topographical features of microelectronic substrates Emerging Cross-Sectional Technologies 0 Expired
US8476109B2 Semiconductor workpiece carriers and methods for processing semiconductor workpieces Emerging Cross-Sectional Technologies 0 Active
US7691680B2 Method of fabricating microelectronic component assemblies employing lead frames having reduced-thickness inner lengths Emerging Cross-Sectional Technologies 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.