Cheng-Jui Yang
12Patents
2h-index
31Co-inventors
54Inventor score
Filing activity: Aug 6, 1999 → Jan 6, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6426016B1 | Method for etching passivation layers and antireflective layer on a substrate | Electricity | 6 | Expired |
| US10236216B2 | Method for manufacturing a semiconductor device having a fin located on a substrate | Electricity | 2 | Active |
| US9637391B2 | Crystalline silicon ingot including nucleation promotion layer | Emerging Cross-Sectional Technologies | 1 | Active |
| US9493357B2 | Method of fabricating crystalline silicon ingot including nucleation promotion layer | Emerging Cross-Sectional Technologies | 1 | Active |
| US10087080B2 | Methods of fabricating a poly-crystalline silcon ingot from a nucleation promotion layer comprised of chips and chunks of silicon-containing particles | Emerging Cross-Sectional Technologies | 0 | Active |
| US10510830B2 | N-type polysilicon crystal, manufacturing method thereof, and N-type polysilicon wafer | Emerging Cross-Sectional Technologies | 0 | Active |
| US10825940B2 | Polycrystalline silicon column and polycrystalline silicon wafer | Emerging Cross-Sectional Technologies | 0 | Active |
| US10138572B2 | Crystalline silicon ingot and method of fabricating the same | Chemistry; Metallurgy | 0 | Active |
| US9315918B2 | Crystalline silicon ingot and method of fabricating the same | Chemistry; Metallurgy | 0 | Active |
| US10065863B2 | Poly-crystalline silicon ingot having a nucleation promotion layer comprising a plurality of chips and chunks of poly-crystalline silicon on the bottom | Emerging Cross-Sectional Technologies | 0 | Active |
| US10297702B2 | Polycrystalline silicon column and polycrystalline silicon wafer | Emerging Cross-Sectional Technologies | 0 | Active |
| US11971365B2 | Wafer processing system and rework method thereof | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.