Inventor · Beijing, CN

Chenxi Lin

24Patents
7h-index
55Co-inventors
68Inventor score

Filing activity: May 24, 2005 → May 13, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US7502785B2 Extracting semantic attributes Emerging Cross-Sectional Technologies 44 Active
US7844449B2 Scalable probabilistic latent semantic analysis Physics 40 Active
US7634471B2 Adaptive grouping in a file network Emerging Cross-Sectional Technologies 25 Active
US7624130B2 System and method for exploring a semantic file network Emerging Cross-Sectional Technologies 13 Active
US7594013B2 Creating home pages based on user-selected information of web pages Physics 12 Active
US7711735B2 User segment suggestion for online advertising Physics 11 Active
US7555480B2 Comparatively crawling web page data records relative to a template Emerging Cross-Sectional Technologies 10 Active
US7925644B2 Efficient retrieval algorithm by query term discrimination Physics 6 Active
US9300134B2 Methods and systems for power restoration planning Emerging Cross-Sectional Technologies 3 Active
US11947266B2 Method for controlling a manufacturing process and associated apparatuses Physics 3 Active
US7818330B2 Block tracking mechanism for web personalization Physics 3 Active
US11443083B2 Identification of hot spots or defects by machine learning Physics 2 Active
US11803127B2 Method for determining root cause affecting yield in a semiconductor manufacturing process Physics 1 Active
US12044980B2 Method of manufacturing devices Physics 1 Active
US11086229B2 Method to predict yield of a device manufacturing process Physics 1 Active
US7822752B2 Efficient retrieval algorithm by query term discrimination Physics 1 Active
US12360461B2 Identification of hot spots or defects by machine learning Physics 0 Active
US11183434B2 Methods of guiding process models and inspection in a manufacturing process Electricity 0 Active
US8738467B2 Cluster-based scalable collaborative filtering Physics 0 Active
US11181829B2 Method for determining a control parameter for an apparatus utilized in a semiconductor manufacturing process Electricity 0 Active
US12055904B2 Method to predict yield of a device manufacturing process Physics 0 Active
US12045555B2 Method to label substrates based on process parameters Physics 0 Active
US11754931B2 Method for determining corrections for lithographic apparatus Physics 0 Active
US11714357B2 Method to predict yield of a device manufacturing process Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.