Chi-Yuan Sun
11Patents
2h-index
24Co-inventors
50Inventor score
Filing activity: Jun 13, 2012 → Jul 27, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8836049B2 | Semiconductor structure and process thereof | Electricity | 23 | Active |
| US8735269B1 | Method for forming semiconductor structure having TiN layer | Electricity | 3 | Active |
| US9703918B2 | Two-dimensional process window improvement | Physics | 2 | Active |
| US9653300B2 | Structure of metal gate structure and manufacturing method of the same | Electricity | 0 | Active |
| US11448956B2 | EUV mask | Electricity | 0 | Active |
| US9076784B2 | Transistor and semiconductor structure | Electricity | 0 | Active |
| US10199228B2 | Manufacturing method of metal gate structure | Electricity | 0 | Active |
| US11846881B2 | EUV photomask | Electricity | 0 | Active |
| US10274818B2 | Lithography patterning with sub-resolution assistant patterns and off-axis illumination | Physics | 0 | Active |
| US8975666B2 | MOS transistor and process thereof | Electricity | 0 | Active |
| US12196687B2 | Method for inspecting pattern defects | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.