Christopher J. Pass
15Patents
5h-index
23Co-inventors
66Inventor score
Filing activity: Oct 30, 1996 → Aug 29, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5949710A | Programmable interconnect junction | Electricity | 142 | Expired |
| US6956165B1 | Underfill for maximum flip chip package reliability | Electricity | 24 | Expired |
| US6122209A | Method of margin testing programmable interconnect cell | Electricity | 13 | Expired |
| US6573138B1 | Nonvolatile memory cell with low doping region | Electricity | 8 | Expired |
| US10090840B1 | Integrated circuits with programmable non-volatile resistive switch elements | Physics | 8 | Active |
| US7759226B1 | Electrical fuse with sacrificial contact | Electricity | 5 | Expired |
| US10573375B1 | Methods and circuitry for programming non-volatile resistive switches using varistors | Electricity | 5 | Active |
| US6828620B2 | Nonvolatile memory cell with low doping region | Electricity | 2 | Expired |
| US7883946B1 | Angled implantation for deep submicron device optimization | Electricity | 1 | Active |
| US10269426B2 | Integrated circuits with complementary non-volatile resistive memory elements | Physics | 1 | Active |
| US10037992B1 | Methods and apparatuses for optimizing power and functionality in transistors | Electricity | 0 | Active |
| US8912104B1 | Method for fabricating integrated circuits with patterned thermal adjustment layers for design optimization | Electricity | 0 | Active |
| US8492798B1 | Electrical fuse with sacrificial contact | Electricity | 0 | Active |
| US10447275B2 | Integrated circuits with programmable non-volatile resistive switch elements | Physics | 0 | Active |
| US8519403B1 | Angled implantation for deep submicron device optimization | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.