Gilad Almogy
133Patents
18h-index
113Co-inventors
89Inventor score
Filing activity: Jun 5, 1995 → Jan 11, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6122046A | Dual resolution combined laser spot scanning and area imaging inspection | Physics | 147 | Expired |
| USD767484S1 | Solar panel | General | 88 | Active |
| US6236454A | Multiple beam scanner for an inspection system | Physics | 69 | Expired |
| US6841787B2 | Maskless photon-electron spot-grid array printer | Electricity | 64 | Expired |
| US6317514A | Method and apparatus for inspection of patterned semiconductor wafers | Electricity | 61 | Expired |
| US6639201B2 | Spot grid array imaging system | Physics | 59 | Expired |
| US6208751A | Cluster tool | Electricity | 59 | Expired |
| USD750556S1 | Solar panel | General | 52 | Active |
| US6671398B2 | Method and apparatus for inspection of patterned semiconductor wafers | Electricity | 52 | Expired |
| US6124924A | Focus error correction method and apparatus | Physics | 50 | Expired |
| US9075909B2 | System and method to enable detection of viral infection by users of electronic communication devices | Emerging Cross-Sectional Technologies | 39 | Active |
| US9153413B2 | Multi-beam scanning electron beam device and methods of using the same | Electricity | 37 | Active |
| US6791099B2 | Laser scanning wafer inspection using nonlinear optical phenomena | Physics | 34 | Expired |
| US6897941B2 | Optical spot grid array printer | Physics | 33 | Expired |
| US6853446B1 | Variable angle illumination wafer inspection system | Physics | 29 | Expired |
| US9484484B2 | Shingled solar cell module | Emerging Cross-Sectional Technologies | 23 | Active |
| US10344328B2 | Methods for biological sample processing and analysis | Physics | 23 | Active |
| US6657714B2 | Defect detection with enhanced dynamic range | Physics | 22 | Expired |
| US6366352B1 | Optical inspection method and apparatus utilizing a variable angle design | Physics | 18 | Expired |
| US9397252B2 | Shingled solar cell module | Emerging Cross-Sectional Technologies | 17 | Active |
| US10273528B1 | Methods and systems for analyte detection and analysis | Physics | 15 | Active |
| US10267790B1 | Systems for biological sample processing and analysis | Physics | 15 | Active |
| US9356184B2 | Shingled solar cell module | Emerging Cross-Sectional Technologies | 15 | Active |
| US10830703B1 | Methods, devices, and systems for analyte detection and analysis | Physics | 15 | Active |
| US6587193B1 | Inspection systems performing two-dimensional imaging with line light spot | Physics | 14 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.