Inventor · Meitar, IL

Idan Kaizerman

26Patents
6h-index
20Co-inventors
65Inventor score

Filing activity: Apr 19, 2012 → Nov 8, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US9607233B2 Classifier readiness and maintenance in automatic defect classification Physics 15 Active
US9286675B1 Iterative defect filtering process Physics 13 Active
US9715723B2 Optimization of unknown defect rejection for automatic defect classification Physics 12 Active
US10043264B2 Integration of automatic and manual defect classification Physics 10 Active
US9595091B2 Defect classification using topographical attributes Physics 7 Active
US9858658B2 Defect classification using CAD-based context attributes Physics 7 Active
US11205119B2 Method of deep learning-based examination of a semiconductor specimen and system thereof Physics 4 Active
US10161882B1 Method of examining locations in a wafer with adjustable navigation accuracy and system thereof Electricity 3 Active
US10748271B2 Method of defect classification and system thereof Physics 3 Active
US11348001B2 Method of deep learning-based examination of a semiconductor specimen and system thereof Physics 2 Active
US9715724B2 Registration of CAD data with SEM images Physics 2 Active
US10190991B2 Method for adaptive sampling in examining an object and system thereof Emerging Cross-Sectional Technologies 2 Active
US11010665B2 Method of deep learning-based examination of a semiconductor specimen and system thereof Physics 2 Active
US10901402B2 Closed-loop automatic defect inspection and classification Emerging Cross-Sectional Technologies 1 Active
US11526979B2 Method of defect classification and system thereof Physics 1 Active
US10114368B2 Closed-loop automatic defect inspection and classification Emerging Cross-Sectional Technologies 1 Active
US10360669B2 System, method and computer program product for generating a training set for a classifier Physics 1 Active
US11080736B2 Adaptive in-application physical product offers Physics 0 Active
US10663407B2 Method of examining locations in a wafer with adjustable navigation accuracy and system thereof Electricity 0 Active
US10803575B2 System, method and computer program product for generating a training set for a classifier Physics 0 Active
US10818000B2 Iterative defect filtering process Physics 0 Active
US10720367B2 Process window analysis Electricity 0 Active
US10312161B2 Process window analysis Electricity 0 Active
US10896574B2 System and method for outlier detection in gaming Physics 0 Active
US12183066B2 Method of deep learning-based examination of a semiconductor specimen and system thereof Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.