Ivan Lazic
12Patents
3h-index
20Co-inventors
52Inventor score
Filing activity: Jun 17, 2013 → Aug 25, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9312098B2 | Method of examining a sample in a charged-particle microscope | Electricity | 6 | Active |
| US10446366B1 | Imaging technique in scanning transmission charged particle microscopy | Electricity | 4 | Active |
| US10403469B2 | Method of performing tomographic imaging in a charged-particle microscope | Electricity | 3 | Active |
| US8766214B2 | Method of preparing and imaging a lamella in a particle-optical apparatus | Electricity | 3 | Active |
| US9136087B2 | Method of investigating and correcting aberrations in a charged-particle lens system | Electricity | 2 | Active |
| US10607811B1 | Multi-beam scanning transmission charged particle microscope | Electricity | 1 | Active |
| US10573488B2 | Method of performing tomographic imaging in a charged-particle microscope | Electricity | 1 | Active |
| US9959639B2 | Method of ptychographic imaging | Physics | 1 | Active |
| US9202670B2 | Method of investigating the wavefront of a charged-particle beam | Electricity | 1 | Active |
| US11211223B1 | System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy | Electricity | 0 | Active |
| US10665419B2 | Intelligent pre-scan in scanning transmission charged particle microscopy | Electricity | 0 | Active |
| US10699872B2 | Discriminative imaging technique in scanning transmission charged particle microscopy | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.