John V. Jensen
15Patents
8h-index
15Co-inventors
65Inventor score
Filing activity: Feb 27, 1996 → Sep 17, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5705301A | Performing optical proximity correction with the aid of design rule checkers | Physics | 324 | Expired |
| US6269472A | Optical proximity correction method and apparatus | Electricity | 287 | Expired |
| US6282696A | Performing optical proximity correction with the aid of design rule checkers | Physics | 236 | Expired |
| US5900338A | Performing optical proximity correction with the aid of design rule checkers | Physics | 61 | Expired |
| US6499003B2 | Method and apparatus for application of proximity correction with unitary segmentation | Physics | 54 | Expired |
| US6175953A | Method and apparatus for general systematic application of proximity correction | Physics | 16 | Expired |
| US6532585B1 | Method and apparatus for application of proximity correction with relative segmentation | Physics | 8 | Expired |
| US5703376A | Multi-level resolution lithography | Electricity | 8 | Expired |
| US6174630A | Method of proximity correction with relative segmentation | Physics | 8 | Expired |
| US7325222B2 | Method and apparatus for verifying the post-optical proximity corrected mask wafer image sensitivity to reticle manufacturing errors | Physics | 5 | Expired |
| US9072366B2 | Utility bucket backpack apparatus | Performing Operations; Transporting | 3 | Active |
| US7005217B2 | Chromeless phase shift mask | Physics | 3 | Expired |
| US7057261B2 | Mixed LVR and HVR reticle set design for the processing of gate arrays, embedded arrays and rapid chip products | Physics | 2 | Expired |
| US6900075B2 | Mixed LVR and HVR reticle set design for the processing of gate arrays, embedded arrays and rapid chip products | Physics | 0 | Expired |
| US7127698B2 | Method for reducing reticle set cost | Emerging Cross-Sectional Technologies | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.