Jun Fujihara
22Patents
2h-index
21Co-inventors
53Inventor score
Filing activity: Jun 1, 2004 → Dec 15, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7119735B2 | Vehicle-installed radar sensor system and vehicle-installed radar sensor | Physics | 6 | Expired |
| US9346358B2 | Vehicle control apparatus | Performing Operations; Transporting | 3 | Active |
| US11099236B2 | Inspection device and contact method | Physics | 1 | Active |
| US11067624B2 | Inspection system | Physics | 1 | Active |
| US11269004B2 | Inspection apparatus and inspection method for inspecting electrical characteristic of electronic device | Physics | 0 | Active |
| US12065182B2 | Trolley and method for supporting component of substrate processing apparatus | Performing Operations; Transporting | 0 | Active |
| US11454664B2 | Testing system | Electricity | 0 | Active |
| US11467208B2 | Contact release method in inspection apparatus and inspection apparatus | Physics | 0 | Active |
| US11307223B2 | Inspection device and method of controlling temperature of probe card | Physics | 0 | Active |
| US10845409B2 | Substrate inspection device | Electricity | 0 | Active |
| US11385283B2 | Chuck top, inspection apparatus, and chuck top recovery method | Physics | 0 | Active |
| US11169206B2 | Inspection apparatus, inspection system, and aligning method | Physics | 0 | Active |
| US11199575B2 | Prober and probe card precooling method | Physics | 0 | Active |
| US11525859B2 | Insertion/extraction mechanism and method for replacing block member | Physics | 0 | Active |
| US11215640B2 | Prober and probe card cleaning method | Physics | 0 | Active |
| US10901028B2 | Substrate inspection method and substrate inspection device | Physics | 0 | Active |
| US11761704B2 | Inspection apparatus and inspection method | Electricity | 0 | Active |
| US11360115B2 | Inspection system | Physics | 0 | Active |
| US11442096B2 | Testing apparatus | Physics | 0 | Active |
| US11092641B2 | Inspection apparatus and inspection method | Physics | 0 | Active |
| US10935570B2 | Intermediate connection member and inspection apparatus | Physics | 0 | Active |
| US11249132B2 | Prober and method of preheating probe card | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.