Inventor · Musashino, JP

June Sugiura

18Patents
14h-index
14Co-inventors
71Inventor score

Filing activity: Jan 7, 1981 → Apr 4, 1995

Most-cited inventions

PatentTitleAreaCited byStatus
US4651406A Forming memory transistors with varying gate oxide thicknesses Electricity 147 Expired
US4471373A Semiconductor integrated circuit device with memory MISFETS and thin and thick gate insulator MISFETS Electricity 124 Expired
US4663645A Semiconductor device of an LDD structure having a floating gate Emerging Cross-Sectional Technologies 79 Expired
US4788665A Semiconductor memory Physics 65 Expired
US5352620A Method of making semiconductor device with memory cells and peripheral transistors Electricity 61 Expired
US5136546A Semiconductor memory Physics 28 Expired
US4451904A Semiconductor memory device Electricity 27 Expired
US4918501A Semiconductor device and method of producing the same Emerging Cross-Sectional Technologies 26 Expired
US5194924A Semiconductor device of an LDD structure having a floating gate Electricity 23 Expired
US4691298A Semiconductor memory Physics 20 Expired
US5098855A Semiconductor device and method of producing the same Emerging Cross-Sectional Technologies 20 Expired
US4872041A Semiconductor device equipped with a field effect transistor having a floating gate Emerging Cross-Sectional Technologies 18 Expired
US5416347A Semiconductor memory device with additional conductive line to prevent line breakage Emerging Cross-Sectional Technologies 17 Expired
US4731642A Semiconductor memory device with means to prevent word line breakage Emerging Cross-Sectional Technologies 17 Expired
US4905195A Semiconductor memory Physics 7 Expired
US4830977A Method of making a semiconductor memory device Emerging Cross-Sectional Technologies 6 Expired
US4984212A Semiconductor memory Physics 5 Expired
US5580810A Method of making a semiconductor memory device Emerging Cross-Sectional Technologies 3 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.