Inventor · Cheonan-si, KR

Junyoung Ko

17Patents

2h-index

20Co-inventors

50Inventor score

Filing activity: Jul 6, 2011 → Jul 6, 2023

Most-cited inventions

Patent	Title	Area	Cited by	Status
US8998068B2	Removal apparatuses for semiconductor chips	Emerging Cross-Sectional Technologies	41	Active
US10121774B2	Method of manufacturing a semiconductor package	Electricity	5	Active
US8757134B2	Wafer dicing blade and wafer dicing apparatus including the same	Emerging Cross-Sectional Technologies	2	Active
US8749044B2	Semiconductor memory modules and methods of fabricating the same	Electricity	1	Active
US9768141B2	Removal apparatuses for semiconductor chips	Emerging Cross-Sectional Technologies	1	Active
US12308083B2	Volatile memory devices and methods of operating same to improve reliability	Physics	0	Active
US8866295B2	Semiconductor memory modules and methods of fabricating the same	Electricity	0	Active
US11474149B2	Test apparatuses for testing semiconductor packages and manufacturing systems for manufacturing semiconductor packages having the same and methods of manufacturing the semiconductor packages using the same	Electricity	0	Active
US11475956B2	Nonvolatile memory device and method of operating a nonvolatile memory	Electricity	0	Active
US11373942B2	Semiconductor devices	Electricity	0	Active
US12204772B2	Memory devices and methods for managing use history	Physics	0	Active
US10629564B2	Removal apparatuses for semiconductor chips	Emerging Cross-Sectional Technologies	0	Active
US12431212B2	Row decoder circuit, memory device and memory system	Physics	0	Active
US12230312B2	Memory device and defense method thereof	Physics	0	Active
US11798626B2	Nonvolatile memory device and method of operating a nonvolatile memory	Electricity	0	Active
US12347510B2	Bonding defect detection for die-to-die bonding in memory devices	Physics	0	Active
US12131798B2	Non-volatile memory device for detecting defects of bit lines and word lines	Physics	0	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.